MICROSTRUCTURAL CHARACTERIZATION OF SPIN—VALVE MULTILAYERS BY X—RAY ANOMALYOUS DIFFRACTION TECHNIQUE-中国期刊网

摘要 Itisimpossibletodirectlyanalyzethemicrostructureofspin-valvemultilayersbasedonNi,F,CuandMnbyaconventionalX-raydiffractiontechniquebecausethelatticeparameterandatomicsatteringfactorsofthemareveryclose.Tosolvethisproblem,weuseanx-rayanomalousdiffractiontechniquetocharacterizethemicrostructuresofthe[Ni80Fe20/Fe50Mn50]15and[Ni80Fe20/Cu]15superlatticesystems.Theresultsshowthatmorediffractionpeaksandhigherinternsityinthereflectivetyprofileareobservedwhentheincidentenergyisclosetotheabsorptionedgeofthelighterelement(Mn)in[Ni80Fe20/Fe50Mn50]15multilayersystemsandtotheabsorptionedgeoftheheavierelement(Cu)inthe[Ni80Fe20/Cu]15multilayersystems.Theinterfaceandperiodicstructureof[Ni80F20/Fe50Mn50]15aremoreperfectthanthatofthe[Ni80Fe20/Cu]15superlattices.Theaboveresultsaredisussedinthispaper.

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MICROSTRUCTURAL CHARACTERIZATION OF SPIN—VALVE MULTILAYERS BY X—RAY ANOMALYOUS DIFFRACTION TECHNIQUE

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MICROSTRUCTURAL CHARACTERIZATION OF SPIN—VALVE MULTILAYERS BY X—RAY ANOMALYOUS DIFFRACTION TECHNIQUE

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