简介：关于X光折射率小于1的讨论=AdiscussionontherefractiveindexofX—raylessthan1[刊,中]/谭业武(滨州师范专科学校物理系)∥大学物理.—1994.13(11).—22—23,21从几个不同的方面讨论了X光的折射率,并通过

简介：O434.2//TN232001021486紫外线技术在军事上的应用研究=Studyofapplicationofultravioletteehnolgoytomilitaryaffairs[刊,中]/张忠廉,刘榴娣(北京理工大学光电工程系.北京(100081))//光学技术.-2000,26(4).-289-293,296介绍了紫外线在军事上的应用和紫外波段光电探测器件的发展情况以及国内外紫外技术在军事上应用概况,提出了在军事应用方面如何对紫外线技术作进一步研究的建议。(李瑞琴)

简介：应用于高能闪光X光照相技术的X射线源主要是强流电子束与重金属靶相互作用产生的韧致辐射，一般应用电子直线感应加速器（LIA）产生强流电子束，电子束被聚焦到一个很小的焦斑后打靶。进行闪光照相时，X射线斑点大小是一关键参量，直接影响成像的分辨能力。由于高能X射线的强穿透能力和强辐射环境，传统的小孔成像法难以应用。

简介：YBa2Cu3Ox(YBCO)thinfilmsgrownondifferentsubstrateswithand/orwithoutEu2CuO4(ECO)bufferlayerwereinvestigatedbyX-raywideanglediffraction,reflection,diffusescatteringandtopography.TheresultsshowthatfortheyttriastabilizedZrO2(YSZ)substrate,thepresenceofanECObufferlayerimprovesthecrystallinequalityoftheYBCOfilm,whileanegativeeffectisobservedfortheSrTiO3(STO)substrate.ThelateralcorrelationlengthforasamplegrownonaYSZsubstratewithECObufferLayerismuchgreaterthangrownonanSTOsubetrate.TheSTOsubstrateusedhasmosaicstructure.2001ElsevierScienceB.V.Allrightsreserved.

简介：通过软件实现了用ＰＣ机调用日本Ｒｉｇａｋｕ公司生产的Ｄ／ｍａｘ一类Ｘ射线衍射仪测量数据，利用ＰＣ机的复杂计算功能，使原有仪器也可以进行新的结构分析工作，扩展了仪器的功能。

简介：小角X射线散射(SAXS)是研究多孔材料结构的一种有效方法．可得到孔径分布、平均孔径、比表面、界面层厚度、分形维数等许多微结构信息．SAXS理论公式基于点状光源(针孔准直)，但实践中则大多采用长狭缝准直条件．简要综述了SAXS在长狭缝准直条件下直接应用模糊强度进行煤、炭、二凝胶、分子筛等多孔材料结构解析的方法、并与针孔准直进行了对比。

简介：根据库仑定律和场强的定义,对电力线两种不同的画法进行了讨论

简介：薄壁曲面铅合金铸件（简称铅铸件）采用砂模或金属模铸造，经机械加工成壁厚约3-4mm的变壁厚曲面回转体，要求精加工后内部不得有大于φ0．4mm以上的渣孔类缺陷。

简介：X-γradiationbelongtotheionizingradiation.Ionizingradiationsinkstoenergyinorganismbutproduceadisservicetotheorganism.Justasmedicine,thedisserviceoftheradiationtowardsOrganismisdecidedbytoacceptradiationquantify,theradiationquantifywasnameddose.Radiationprotection'sbasicmissionsistowanttoresultthedosetofixquantify.InthissurveythedoseatworkplaceanditssurroundingsenvironmentsofHL-2Adevicewasmeasuredandtheassessmentwasgivenout.

简介：SmallangleX-rayscatteringexperimentshavebeenperformedtostudythemicrostructureofmessoporoussilicameterialspreparedbycondensationoftetraethylorthosilicateusingnonionicalkylpolyethyleneoxide(AEO9)andioniccetyltrimethylammoniumbromide(CTAB)surfactantastemplates.Itistheporeswithinthenanometrerangethatproducethemaincattering.ThescatteringofthepuresilicasystemsobeyPorod’slaw.Thismaybebecausethetemplatesproducesomeadditionalscatteringbackgroundandthenmakethescatteringofporesdistorted.TheresultsshowthatthefullremovaloftemplatesfromtheporesofthematerialsbySoxhletextractionisveryeasyforAEO9,butitisdifficultforCTAB.Thepositivedeviationcorrectionisalsoperfromed.

简介：ThispaperresentsanewX-rayimagingmethodswingLaminography(SL)thatissuitalbletoperformnon-destructivetestingontheslender-shapedmulti-layersamples.ComputersimulationsaremadetocomparethelimitedprojectionsinSLandtheprincipleofchoosingOptimalProjectionAngularRegion(OPAR)isdiscussed.Theexperimentonatwo-layerPrintedCircuitsBoardshowsthatSLwith120°swinganglesdistributedinOPARcangettheseparatedimagesofeachlayer.

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简介：Itisimpossibletodirectlyanalyzethemicrostructureofspin-valvemultilayersbasedonNi,F,CuandMnbyaconventionalX-raydiffractiontechniquebecausethelatticeparameterandatomicsatteringfactorsofthemareveryclose.Tosolvethisproblem,weuseanx-rayanomalousdiffractiontechniquetocharacterizethemicrostructuresofthe[Ni80Fe20/Fe50Mn50]15and[Ni80Fe20/Cu]15superlatticesystems.Theresultsshowthatmorediffractionpeaksandhigherinternsityinthereflectivetyprofileareobservedwhentheincidentenergyisclosetotheabsorptionedgeofthelighterelement(Mn)in[Ni80Fe20/Fe50Mn50]15multilayersystemsandtotheabsorptionedgeoftheheavierelement(Cu)inthe[Ni80Fe20/Cu]15multilayersystems.Theinterfaceandperiodicstructureof[Ni80F20/Fe50Mn50]15aremoreperfectthanthatofthe[Ni80Fe20/Cu]15superlattices.Theaboveresultsaredisussedinthispaper.

简介：Small-angleX-rayscattering(SAXS)usingsynchrotronradiationasX-raysourcehasbeenemployedtocharactcizcthemicroscopicstructrureoforgano-modifiedmesoporousmolecularsieves(organo-MSU-X)preparedbyaone-pottemplate-directedsynthesis.ItisshownthattheSAXSprofileishardlyconstantwithPorod’slawshowinganegativeslope,i.e.,negativedeviation.Thissuggeststhatthereisdiffuseinterfaciallayerlocatedbetweentheporesandthematrix.Thissuggeststhattheorganicgroupsremaincovalentlylinkedtothematrix,asindicatedby^29SiCPMASNMRandFT-IR.Theaveragethicknessoftheinterfaciallayerwasfoundtobeabout1nmforeachofthethreesampleswithdifferentkindsandthesameamounts(20?oforganicgroups.Thiskindofmaterialhasalsobeenprovedtopossessbothsurfaceandmassfractalstructureoftheamophousporoussilicamaterials.2001ElsevierScienceB.V.Allrightsreserved.

简介：O434．122006065468强脉冲软X光辐照薄塑料闪烁体发光特性研究=LinearluminescenceforthinplasticscintillatorsunderintensesoftX-rayirradiation[刊,中]/宁家敏(中物院核物理与化学研究所．四川,绵阳(621900)),蒋世伦…//强激光与粒子束．—2006,18(7)．—1215-1218介绍了Z-pinch实验用软X光功率仪的测量原理,利用“强光一号”产生的强脉冲软X光对薄塑料闪烁体((?)40min×0．1mm)进行了辐照。实验中,采用两套软X光功率仪并安装在同一个大法兰面上．其中一套作为标准系统,参数保持不变,另一套系统的狭缝宽度逐渐增加,以改

简介：在北京同步辐射装置上应用同步辐射X射线小角散射技术研究TATB样品微孔状况，分析了微孔结构参数的变化。采用不同制备工艺(机械研磨、化学合成、气流细化、全结晶、粉碎)和不同存放时间的TATB粉末样品共计7份。

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简介：ThefabricationofX-raymasksisacriticalandchallengingprocessinLIGAtechnique.Asinductivelycoupledplasma(ICP)deepetchingappearstobethemostsuitablesourcefordeepsiliconetching,wefabricatedanewtypeX-raymaskusingthistechnique.IncomparisonwithothertypesofX-raymasks,themaskwefabricatedhastheadvantagesofitslowcostanditssimplefabricationprocess.BesiredmicrostructureshavealsobeenfabricatedusingthisnewtypeX-raymaskinLIGAtechnique.

简介：ThegrowinginterestintheuseofGalliumArsenidssemiconductormaterialshaspresentedmanyopportunitiesfordeviceoperationalspeedimprovementsbuthasalsopresentedmanyproblemsforthedevicemaker,Anoveldeep-submicronx-raylithographyprocessforT-shapedgatepatternsusefulforhigh-electron-mobilitytransistors(HEMT)isintroducedinthiswork.InthefabricationofT-shapedgateatherrlayerresistsmethodisused.Thex-rayexposureexperimentswerefinishedbyBeijingSynchrotronRadiationFacility(BSRF)3B1Abeamline,andgoodresulthasbeenobtained.

简介：新型XRD不论是响应特性，还是外形体积，都必须满足谱仪小型化的要求。其次，需考虑色散元件，谱仪仍采取滤波法。由于三倍频打靶M带辐射强度大幅度提高，高能尾部对输出信号的贡献很大，所有探测道都必须抑制高能尾部，用掠入射平面镜截止的能量就更高。用平面镜截止高能X射线的途径：一是平面镜使用高原子序数材料，二是减小掠射角。